Scientific research has seen an increased need for charged beam technologies, from scanning electron microscopes to focused ion beams. These devices use charged beams as the core technology for their imaging of nano-scaled materials and devices.

Our primary interest involves the use of focused ion beam systems and investigating different exotic ion source material and emitter designs based on the liguid metal ion source (LMIS), needle reservoir emitters. We have the capacity in the lab to build, wet and test our ion sources. Testing can be accomplished with lifetime testing and ion species determination. An in-house testing system has been developed along with the use of a home-built FIB system to use proven designs of LMIS emitters.

Explanation of images:

(top left and right) SEM images of Gallium LMIS and unwetted Tugsten substrate.

(left middle) Home-built fib with FEI OEM gun.

(left bottom) 3D concept of FEI OEM FIB gun.

(right bottom) Lifetime and species testing chamber.