Research

|
My research at Portland
State University focuses on digital imagers:
Charge-Coupled Devices (CCDs)
and and more recently
Complementary Metal–Oxide–Semiconductors (CMOS)
CCDs are digital imagers found in most digital
cameras but also in high-end applications in science and astronomy.
CMOS
sensors are more common in consumer or cell phone cameras. They have
also found their way into higher-end applications in recent years.
At
PSU we have characterized digital imagers since 1996.
Recent
projects include:
Residual images and the Point spread
function (PSF) in a CCD.
Dark current in CCD and CMOS cameras from lower grade consumer cameras
to high end scientific cameras.
|
Teaching
General
Physics
Workshops
for General Physics
General
Physics Laboratory
Physics
in Biomedicine
Selected Publications
Justin
C. Dunlap, Oleg Sostin, Erik Bodegom, and Ralf Widenhorn, Dark current
behavior
in DSLR cameras, Proceedings of SPIE Volume: 7249 (2009)
Ralf
Widenhorn, Ines Hartwig, Justin C. Dunlap, and Erik Bodegom,
Measurements of
dark current in a CCD imager during light exposures, Proceedings of
SPIE
Volume: 6816 (2008)
William
Porter, Bradley Kopp, Justin C. Dunlap, Ralf Widenhorn, and Erik
Bodegom, Dark
Current Measurements in a CMOS Imager, Proceedings of SPIE Volume: 6816 (2008)
Ralf Widenhorn; Armin
Rest; Morley M. Blouke; Richard L. Berry; Erik Bodegom, Computation
of dark frames in digital imagers,
Proceedings of SPIE Volume: 6501 (2007)
Erik Bodegom,
Matthias Loch, and Ralf Widenhorn, Dual Meyer-Neldel Rules for Infrared
Light
in a Charge-Coupled Device, International Symposium, Optro 2005, Paris,
France
Matthias Loch,
Ralf Widenhorn,
and Erik Bodegom, Infrared response of
charge-coupled devices, Proceedings
of SPIE Volume: 5677 (2005)
Ralf Widenhorn, Michael
Fitzgibbons, and Erik Bodegom The
Meyer-Neldel rule for diodes in forward bias, J. Appl. Phys. 96, 7379
(2004)
E. Bodegom, R.
Widenhorn, and D. A. Iordache, New Meyer-Neldel relations for
the
depletion and diffusion dark currents in some CCDs, Presented at
International
Semiconductor Conference (CAS) 2004, Sinaia, Romania
Ralf Widenhorn, Richard Berry, Armin Rest,
and Erik Bodegom,
Computation of dark frames, patent pending
Ralf Widenhorn, Ph. D. Thesis, “Characterization and
modeling of dark current, residual images, and the point-spread
function in
charge-coupled devices”
(2004)
E. Bodegom, R.
Widenhorn, D. A. Iordache, and V. Iordache, Numerical analysis of
experimental data concerning the temperature dependence of dark current
in
CCDs, Proceedings of the 28th Annual Congress of
the
American-Romanian Academy of Arts and Sciences (ARA), vol.2, 763, (2003)
Ralf Widenhorn,
Morley M. Blouke, Alexander Weber, Armin Rest, and Erik Bodegom, Proc.
2003
IEEE Workshop on Charge-coupled Devices and Advanced Image Sensors
(Schloss
Elmau, Germany, May 2003)
Ralf Widenhorn,
Alexander Weber, Morley M. Blouke, Albert J. Bae, and Erik Bodegom, PSF
measurements on back-illuminated CCDs, Proc. SPIE Int. Soc.
Opt. Eng. 5017,
176 (2003)
Ralf Widenhorn, Erik
Bodegom, Interpreting fitting parameters, Proceedings of the second
edition of
the Colloquium "Mathematics in engineering of numerical physics", Bucharest, 26
(2002)
Ralf Widenhorn, Armin
Rest, and Erik Bodegom, The Meyer-Neldel rule for a property determined
by two
transport mechanisms, J. Appl. Phys. 91, 6524 (2002)
Armin Rest, Lars
Mündermann,
Ralf Widenhorn, Erik Bodegom, and T. C. McGlinn, Residual images in
charged-coupled device detectors, Rev. Sci. Instrum. 73, 2028
(2002)
Ralf Widenhorn,
Morley M. Blouke, Alexander Weber, Armin Rest, and Erik Bodegom,
Temperature
dependence of dark current in a CCD, Proc. SPIE Int. Soc. Opt.
Eng. 4669,
193 (2002)
Ralf Widenhorn, Lars
Mündermann, Armin Rest, and Erik Bodegom, Meyer-Neldel rule for
dark current in
charge-coupled devices, J. Appl. Phys. 89, 8179 (2001)
Ralf Widenhorn, M. S.
Thesis “Spectroscopy of dark current in CCD imagers”, 2000
|